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Title: Measurements of diffuse and specular scattering of sup 4 He atoms from sup 4 He films

Miscellaneous ·
OSTI ID:6955545

We have observed scattering of {sup 4}He atomic beams from films of {sup 4}He on glass and mica substrates. The specular reflection coefficient, or reflectivity, R(k,{theta}) was measured as a function of the angle of incidence {theta} and the wavevector k of the incident atoms, and the thickness of the film. The film thickness d varied from 45 {angstrom} to macroscopic values. In contrast to previous experiments on scattering from 10 cm deep liquid, we observed not only the expected specular reflection, but also isotropic diffuse scattering. To explain the diffuse signal, we assume that most of the incident atoms are converted into phonons, rotons and ripplons at the surface of the film. The phonons and rotons are scattered at the substrate, and subsequently evaporate an isotropic distribution of atoms.

Research Organization:
Ohio State Univ., Columbus, OH (USA)
OSTI ID:
6955545
Resource Relation:
Other Information: Thesis (Ph. D.)
Country of Publication:
United States
Language:
English