Time-of-flight secondary ion mass spectrometry of deuterated linear poly(dimethylsiloxane)

Journal Article · Mon Aug 29 00:00:00 EDT 1994 · Macromolecules; (United States)

DOI:https://doi.org/10.1021/ma00096a058· OSTI ID:6931234

Zhang, X K; Stuart, J O; Clarson, S J ^[1]; Sabata, A ^[2]; Beaucage, G ^[3]

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1. Univ. of Cincinnati, OH (United States)
2. Armco Research and Technology, Middletown, OH (United States)
3. Sandia National Labs., Albuquerque, NM (United States)

Mass spectrometry (MS) has previously proved to be very valuable for characterizing the thermal decomposition of poly-(dimethylsiloxane) (PDMS) via pyrolysis-MS. Secondary ion mass spectrometry (SIMS) has also been applied to identify the various fragments characteristic of PDMS and thus give fingerprint'' spectra for identification purposes. This paper describes the characterization of deuterated linear PDMS -[(CD[sub 3])[sub 2]SiO][sub n]- using time-of-flight secondary ion mass spectrometry. The work is part of a program investigating the conformations and interactions of deuterated siloxanes in isotopic blends -[(CD[sub 3])[sub 2]SiO][sub n]-/-[CH[sub 3][sub 2]SiO][sub n]- using small-angle neutron scattering. It is therefore clearly important to demonstrate that no deuterium/hydrogen exchanges occurred during the synthetic methodology used.

• DOE Contract Number: AC04-94AL85000
• OSTI ID: 6931234
• Journal Information: Macromolecules; (United States), Vol. 27:18; ISSN 0024-9297
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
POLYMERS
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
SILOXANES
DEUTERATION
EXPERIMENTAL DATA
ISOTOPIC EXCHANGE
SMALL ANGLE SCATTERING
TIME-OF-FLIGHT MASS SPECTROMETERS
CHEMICAL ANALYSIS
CHEMICAL REACTIONS
DATA
DYNAMIC MASS SPECTROMETERS
INFORMATION
MASS SPECTROMETERS
MEASURING INSTRUMENTS
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC SILICON COMPOUNDS
SCATTERING
SPECTROMETERS
SPECTROSCOPY
TIME-OF-FLIGHT SPECTROMETERS
400102* - Chemical & Spectral Procedures