Process for measuring degradation of sulfur hexafluoride in high voltage systems
A process is described for detecting by-products from electrically induced degradation of SF/sub 6/ in high voltage systems comprising: at a pressure within the reaction cell sufficient to cause electron attachment to SF/sub 6/, placing an SF/sub 6/ gas to be tested in an ion-molecule reaction cell having a cathode at a first end, an anode opposite the cathode at a second end, a pin hole aperture incorporated into the anode that opens into a negative ion mass spectrometer that is at a lower pressure than is the reaction cell; producing thermal electrons at the cathode thereby ionizing molecules of the SF/sub 6/ gas in the vicinity of the cathode to form SF/sub 6//sup -/ ions; applying an electrical field in the reaction cell to induce the transfer of the SF/sub 6//sup -/ ions from the cathode to the anode resulting in the formation of by-product ions from intervening by-product molecules having a high affinity for fluoride ions; introducing a combination of the SF/sub 6//sup -/ ions and the by-product ions into the pin hole aperture thereby effecting flow of the combination of ions from the reaction cell to the negative ion mass spectrometer; and detecting the by-product ions using negative ion mass spectrometry techniques.
- Assignee:
- Dept. of Energy, Washington, DC
- Patent Number(s):
- US 4633082
- OSTI ID:
- 6903654
- Resource Relation:
- Patent File Date: Filed date 23 Apr 1985
- Country of Publication:
- United States
- Language:
- English
Similar Records
Process for measuring degradation of sulfur hexafluoride in high voltage systems
Negative ion states of sulfur hexafluoride
Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
SULFUR FLUORIDES
ELECTROLYSIS
AFFINITY
ANIONS
ANODES
APERTURES
BY-PRODUCTS
CATHODES
ELECTRIC FIELDS
ELECTRIC POTENTIAL
ELECTROLYTIC CELLS
ELECTRON ATTACHMENT
FLUORIDES
GASES
ION DETECTION
IONIZATION
MASS SPECTROMETERS
MOLECULES
PRESSURE DEPENDENCE
CHARGED PARTICLE DETECTION
CHARGED PARTICLES
DETECTION
ELECTRODES
FLUIDS
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
IONS
LYSIS
MEASURING INSTRUMENTS
OPENINGS
RADIATION DETECTION
SPECTROMETERS
SULFUR COMPOUNDS
400400* - Electrochemistry