Test probe for surface mounted leadless chip carrier

Patent · Fri Oct 02 00:00:00 EDT 1987

OSTI ID:6867816

Meyer, K L; Topolewski, J

A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.

• Research Organization: Allied Corp., Kansas City, MO (USA). Bendix Kansas City Div.
• DOE Contract Number: AC04-76DP00613
• Assignee: TIC; EDB-88-179049
• Patent Number(s): PATENTS-US-A6103865
• OSTI ID: 6867816
• Resource Relation: Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ELECTRIC PROBES
DESIGN
CONNECTORS
ELECTRICAL TESTING
ELECTRONIC CIRCUITS
INVENTIONS
PRINTED CIRCUITS
CONDUCTOR DEVICES
ELECTRICAL EQUIPMENT
EQUIPMENT
MATERIALS TESTING
NONDESTRUCTIVE TESTING
PROBES
TESTING
420800* - Engineering- Electronic Circuits & Devices- (-1989)