Observation and prediction of SEU in Hitachi SRAMs in low altitude polar orbits

Conference · Wed Dec 01 00:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6839981

Harboe-Sorensen, R; Daly, E J; Adams, L ^[1]; Underwood, C I ^[2]; Mueller, R ^[3]

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1. European Space Agency/ESTEC, Noordwijk (Netherlands)
2. Univ. of Surrey, Guildford (United Kingdom). Surrey Satellite Technology
3. Technische Univ. Braunschweig (Germany). Institut fuer Datenverarbeitungsanlagen

In-orbit SEU data from three microsatellites are separated into Galactic Cosmic Ray (GCR), South Atlantic Anomaly (SAA) and solar flare upsets. Heavy ion and proton testing of the same devices are reported and predictions using LET-dependent ion cross sections and a 2-parameter fit to proton cross section data are compared with in-flight data. SEU trends in memory devices from a single manufacturer, from 16 K-bit to 4 M-bit, are identified.

• OSTI ID: 6839981
• Report Number(s): CONF-930704-; CODEN: IETNAE
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:6Pt1; Conference: NSREC '93: international nuclear and space radiation effects conference, Snowbird, UT (United States), 19-23 Jul 1993; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MEMORY DEVICES
PHYSICAL RADIATION EFFECTS
COMPARATIVE EVALUATIONS
COSMIC RADIATION
SATELLITES
SOLAR PARTICLES
SPACE FLIGHT
EVALUATION
IONIZING RADIATIONS
RADIATION EFFECTS
RADIATIONS
SOLAR RADIATION
STELLAR RADIATION
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems