Waste-surface mapping of the Fernald K-65 silos using a structured light measurement system
Waste-surface mapping of the Fernald K-65 silos using a structured light measurement system A remotely operated surface-mapping measurement system was developed by the Robotics Process Systems Division at Oak Ridge National Laboratory for use in the K-65 waste-storage silos at Fernald, Ohio. The mapping system used three infrared line-generating laser diodes as illumination sources and three high-resolution, low-lux, calibrated, black-and-white, charge-coupled-device video cameras as receivers. These components were combined to form structured light source range and direction sensors with six different possible emitter-receiver pairs. A technology demonstration and predeployment tests were performed at Fernald using the empty Silo 4 into which was placed rectangular objects of known dimensions. These objects were scanned by the structured light sources to demonstrate functionality and verify that the system was giving sufficiently accurate range data in three dimensions. The structured light sources were deployed in Silos 1 and 2 to scan the waste surfaces. The resulting data were merged to create three-dimensional maps of those surfaces. A bentonite clay cap was placed over the waste surfaces and surface maps were obtained. The change in surface height before and after bentonite addition was utilized as a measure of clay cap thickness.
Enter terms in the toolbar above to search the full text of this document for pages containing specific keywords.