Dependence of astigmatism, far-field pattern, and spectral envelope width on active layer thickness of gain guided lasers with narrow stripe geometry

Journal Article · Fri Jun 15 00:00:00 EDT 1984 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.94660· OSTI ID:6752286

Mamine, T

The effects of active layer thickness on the astigmatism, the angle of far-field pattern width parallel to the junction, and the spectral envelope width of a gain guided laser with a narrow stripe geometry have been investigated analytically and experimentally. It is concluded that a large level of astigmatism, a narrow far-field pattern width, and a rapid convergence of the spectral envelope width are inherent to the gain guided lasers with thin active layers.

• Research Organization: Semiconductor Research Department, Semiconductor Group, Sony Corporation, Atsugi-Plant, 4-14-1 Asahi-cho, Atsugi-shi 243, Japan
• OSTI ID: 6752286
• Journal Information: Appl. Phys. Lett.; (United States), Vol. 44:12
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
LASER MATERIALS
THICKNESS
SEMICONDUCTOR LASERS
OPTICAL PROPERTIES
ANALYTICAL SOLUTION
GAIN
LASER RADIATION
LAYERS
SHAPE
AMPLIFICATION
DIMENSIONS
ELECTROMAGNETIC RADIATION
LASERS
MATERIALS
PHYSICAL PROPERTIES
RADIATIONS
SEMICONDUCTOR DEVICES
420300* - Engineering- Lasers- (-1989)