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Title: Implementing QML (Qualified Manufacturers List) for radiation hardness assurance

Abstract

Statistical process control (SPC) of technology parameters relevant to radiation hardness, test structure to Integrated Circuit (IC) correlation, and extrapolation from laboratory to threat scenarios are keys to implementing Qualified Manufacture's List (QML) for radiation hardness assurance in a cost-effective manner. Data from approximately 300 wafer lots fabricated in Sandia's 4/3-{mu}m and Complementry Metal Oxide Semiconductor (CMOS) IIIA (2-{mu}m) technologies are used to demonstrate approaches to, and highlight issues associated with, implementing QML for radiation-hardened CMOS in space applications. An approach is demonstrated to implement QML for signal-event upset SEU immunity on 16k SRAMs that involves relating values of feedback resistance to system error rates. It is seen that the process capability indices, C{sub p} and C{sub pk}, for the manufacture of 400 k{Omega} feedback resistors required to provide SEU tolerance do not conform to 6{sigma}'' quality standards. For total-dose, {triangle}V{sub it} shifts measured on transistors are correlated with circuit response in the space environment. SPC is illustrated for {triangle}V{sub it}, and violations of SPC rules are interpreted in terms of continuous improvement. Finally, design validation for SEU, and quality conformance inspections for total-dose, are identified as major obstacles to cost-effective QML implementation. Techniques and tools that will help QMLmore » provide real cost savings are identified as physical models, three-dimensional device-plus-circuit codes, and improved design simulators. 29 refs., 10 figs., 1 tab.« less

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Org.:
USDOD; DOE/DP
OSTI Identifier:
6727928
Report Number(s):
SAND-90-1845C; CONF-900723-15
ON: DE90015697
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Conference
Resource Relation:
Conference: 27. IEEE annual international nuclear and space radiation effects conference, Reno, NV (USA), 16-20 Jul 1990
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE; 36 MATERIALS SCIENCE; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ELECTRONIC EQUIPMENT; RADIATION HARDENING; MANUFACTURERS; QUALITY ASSURANCE; BALLISTIC MISSILE DEFENSE; COST BENEFIT ANALYSIS; DOSE RATES; EXTRAPOLATION; FEEDBACK; IMPLEMENTATION; INTEGRATED CIRCUITS; MEMORY DEVICES; PERFORMANCE TESTING; REGULATIONS; RESPONSE FUNCTIONS; SENSITIVITY; SHIELDING; STANDARDS; STATISTICAL MODELS; TECHNOLOGY ASSESSMENT; VALIDATION; VARIATIONS; VIOLATIONS; VULNERABILITY; ELECTRONIC CIRCUITS; EQUIPMENT; FUNCTIONS; HARDENING; MATHEMATICAL MODELS; MICROELECTRONIC CIRCUITS; NATIONAL DEFENSE; NUMERICAL SOLUTION; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; TESTING; 426000* - Engineering- Components, Electron Devices & Circuits- (1990-); 450500 - Military Technology, Weaponry, & National Defense- Strategic Defense Initiative- (1990-); 360605 - Materials- Radiation Effects; 990200 - Mathematics & Computers; 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems

Citation Formats

Winokur, P S, Sexton, F W, Fleetwood, D M, Terry, M D, Shaneyfelt, M R, Dressendorfer, P V, and Schwank, J R. Implementing QML (Qualified Manufacturers List) for radiation hardness assurance. United States: N. p., 1990. Web.
Winokur, P S, Sexton, F W, Fleetwood, D M, Terry, M D, Shaneyfelt, M R, Dressendorfer, P V, & Schwank, J R. Implementing QML (Qualified Manufacturers List) for radiation hardness assurance. United States.
Winokur, P S, Sexton, F W, Fleetwood, D M, Terry, M D, Shaneyfelt, M R, Dressendorfer, P V, and Schwank, J R. 1990. "Implementing QML (Qualified Manufacturers List) for radiation hardness assurance". United States.
@article{osti_6727928,
title = {Implementing QML (Qualified Manufacturers List) for radiation hardness assurance},
author = {Winokur, P S and Sexton, F W and Fleetwood, D M and Terry, M D and Shaneyfelt, M R and Dressendorfer, P V and Schwank, J R},
abstractNote = {Statistical process control (SPC) of technology parameters relevant to radiation hardness, test structure to Integrated Circuit (IC) correlation, and extrapolation from laboratory to threat scenarios are keys to implementing Qualified Manufacture's List (QML) for radiation hardness assurance in a cost-effective manner. Data from approximately 300 wafer lots fabricated in Sandia's 4/3-{mu}m and Complementry Metal Oxide Semiconductor (CMOS) IIIA (2-{mu}m) technologies are used to demonstrate approaches to, and highlight issues associated with, implementing QML for radiation-hardened CMOS in space applications. An approach is demonstrated to implement QML for signal-event upset SEU immunity on 16k SRAMs that involves relating values of feedback resistance to system error rates. It is seen that the process capability indices, C{sub p} and C{sub pk}, for the manufacture of 400 k{Omega} feedback resistors required to provide SEU tolerance do not conform to 6{sigma}'' quality standards. For total-dose, {triangle}V{sub it} shifts measured on transistors are correlated with circuit response in the space environment. SPC is illustrated for {triangle}V{sub it}, and violations of SPC rules are interpreted in terms of continuous improvement. Finally, design validation for SEU, and quality conformance inspections for total-dose, are identified as major obstacles to cost-effective QML implementation. Techniques and tools that will help QML provide real cost savings are identified as physical models, three-dimensional device-plus-circuit codes, and improved design simulators. 29 refs., 10 figs., 1 tab.},
doi = {},
url = {https://www.osti.gov/biblio/6727928}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 1990},
month = {Mon Jan 01 00:00:00 EST 1990}
}

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