Method for reduction of selected ion intensities in confined ion beams
Patent
·
OSTI ID:672607
A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer. 7 figs.
- Research Organization:
- Battelle Memorial Institute, Columbus, OH (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC06-76RL01830
- Assignee:
- Battelle Memorial Inst., Richland, WA (United States)
- Patent Number(s):
- US 5,767,512/A/
- Application Number:
- PAN: 8-583,324
- OSTI ID:
- 672607
- Resource Relation:
- Other Information: PBD: 16 Jun 1998
- Country of Publication:
- United States
- Language:
- English
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