Primary recrystallization in a grain oriented silicon steel: On the origin of Goss {l_brace}110{r_brace}<001> grains
A cast ingot (200 kg) of Fe-3% Si (with 300 ppm of C and Al and 80 ppm of N{sub 2}) was roughed in a slab of 50 mm thickness. After reheating at 1330 C, the slab was hot rolled to 2.1 mm. Hot rolled material was then cold rolled to 70 and 90% reductions. Samples were annealed in a salt bath at 650 (70% deformed) and 550 C (90% deformed) for different times. The maximum annealing times were selected to fully recrystallize the samples while avoiding any noticeable post-recrystallization grain growth. X-ray ODFs (orientation distribution functions) were measures to characterize the global textural changes. Volume fractions for individual texture components were obtained by convoluting the respective X-ray ODFs with suitable model functions (using 16.5{degree} Gaussian spread). Microtextural observations were made with OIM (orientation imaging microscopy). X-ray measurements were obtained from the rolling planes (e.g. containing rolling (RD) and transverse (TD) directions), while OIM measurements were made on the long transverse sections (e.g., containing RD and normal (ND) directions). Both X-ray texture and OIM measurements were obtained at approximately 25% of the thickness of the rolled sheets.
- OSTI ID:
- 665215
- Journal Information:
- Scripta Materialia, Vol. 39, Issue 8; Other Information: PBD: 15 Sep 1998
- Country of Publication:
- United States
- Language:
- English
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