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Title: A low noise FET with integrated charge restoration for radiation detectors

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:6609321
;  [1]
  1. Link Analytical Ltd., Halifax Road, High Wyucombe, Bucks, HP 123SE (GB)

A novel pulsed, non-optical, reset technique for use in charge sensitive amplifiers and radiation detectors is described. The first stage FET and charge restoration are integrated into one 5-terminal device labelled the Pentafet. A pulse of minority carriers is injected directly into the channel of the FET. The technique is fast and there are no after effects on the operation of the FET. Very low noise performance is achieved even at high count rates. The high energy rate product capability of the device is demonstrated by analyzing Mn x-rays in the presence of high energy electrons from an Sr 90 beta source and in a transmission electron microscope (TEM).

OSTI ID:
6609321
Report Number(s):
CONF-900143-; CODEN: IETNA; TRN: 90-031703
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Vol. 37:2; Conference: Institute for Electronic and Electrical Engineers (IEEE) nuclear science symposium, San Francisco, CA (USA), 15-19 Jan 1990; ISSN 0018-9499
Country of Publication:
United States
Language:
English

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