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Title: P-I-N CdTe gamma-ray detectors by liquid phase epitaxy (LPE)

Conference ·
OSTI ID:6556533

A new device concept of CdTe gamma ray detectors has been demonstrated by using p+(HgCdTe)-n(CdTe)-n+(HgCdTe) diode structures. Both p+ and n/sup +/-type Hg/sub 0.25/Cd/sub 0.75/Te epilayers were grown by the liquid phase epitaxy (LPE) technique on semi-insulating CdTe sensor elements. The LPE-grown P-I-N structure offers potential advantages for p-n junction formation and ohmic contact over standard ion-implanted diodes or Schottky barrier devices. Detectors with active areas of 2 mm/sup 2/ were fabricated. Resolutions of 10 keV were obtained for the 122 keV gamma peak of Co/sup 57/ at room temperature.

Research Organization:
Rockwell International Corp., Thousand Oaks, CA (USA). Science Center; Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6556533
Report Number(s):
SAND-84-1036C; CONF-841156-1; ON: DE84012276
Resource Relation:
Conference: Nuclear science symposium, Orlando, FL, USA, 1 Nov 1984; Other Information: Portions are illegible in microfiche products
Country of Publication:
United States
Language:
English