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Title: Intrinsic and interfacial recombination in OMVPE- and MBE-prepared GaAs/Al[sub x]Ga[sub 1-x]As heterostructures

Conference ·
OSTI ID:6540108
; ; ;  [1]; ;  [2]
  1. International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center
  2. Sandia National Labs., Albuquerque, NM (United States)

We have studied intrinsic free-carrier recombination in a variety of GaAs structures, including: OMVPE- and MBE-prepared GaAs/Al[sub x]Ga[sub 1-x]As double heterostructures, Na[sub 2]S passivated GaAs structures and bare GaAs structures. We find OMVPE prepared structures are superior to all of these other structures with 300 K lifetimes of [approximately] 2.5 [mu]s and negligible nonradiative interface and bulkrecombination, and thus are truly surface-free (S < 40 cm/s). Moreover, we observe systematic trends in optical properties versus growth conditions. Lastly, we find that the presence of free-exciton recombination in the low-temperature photoluminescence spectra is a necessary but not sufficient condition for optimal optical properties (i.e. long minority-carrier lifetimes).

Research Organization:
Sandia National Labs., Albuquerque, NM (United States); International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center
Sponsoring Organization:
USDOE; USDOD; USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6540108
Report Number(s):
SAND-93-0609C; CONF-930880-1; ON: DE93009844; CNN: N00014-85-C-0868; N00014-90-C-0077; N00014-91-J-1697
Resource Relation:
Conference: International conference on the physics of semiconductors, Beijing (China), 10-14 Aug 1993
Country of Publication:
United States
Language:
English