Quantitative analysis of TATB impurities by thin layer chromatography. Process development endeavor No. 205

Technical Report · Sat Jan 01 00:00:00 EST 1983

OSTI ID:6494977

Schaeffer, C L

A method for quantitative analysis of impurities in TATB was developed using a densitometer to analyze spots on thin-layer chromatographic plates. The precision associated within the densitometer averaged 3.98% standard deviation. Spotting and developing the plate decreased the precision to 5.4% standard deviation.

• Research Organization: Mason and Hanger-Silas Mason Co., Inc., Amarillo, TX (United States)
• DOE Contract Number: AC04-76DP00487
• OSTI ID: 6494977
• Report Number(s): MHSMP-83-06; ON: DE83007094
• Country of Publication: United States
• Language: English

Related Subjects

45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
TATB
IMPURITIES
QUANTITATIVE CHEMICAL ANALYSIS
EXPERIMENTAL DATA
THIN-LAYER CHROMATOGRAPHY
CHEMICAL ANALYSIS
CHEMICAL EXPLOSIVES
CHROMATOGRAPHY
DATA
EXPLOSIVES
INFORMATION
NUMERICAL DATA
SEPARATION PROCESSES
450100* - Military Technology
Weaponry
& National Defense- Chemical Explosions & Explosives