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Title: High-resolution photoelectron spectrometry of selected ns prime and nd prime autoionization resonances in Ar, Kr, and Xe

Journal Article · · Physical Review, A (General Physics); (USA)
; ;  [1]; ;  [2];  [3]
  1. University of Central Florida, Orlando, Florida 32816 (USA)
  2. Oak Ridge National Laboratory, Oak Ridge, TN (USA)
  3. Linkoeping Institute of Technology, S-58183, Linkoeping (Sweden)

Photoionization cross sections ({sigma}) and photoelectron angular distribution parameters ({beta}) across the ({ital ns}{prime},{ital nd}{prime}) autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 A by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the {ital ns}{prime} resonances.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
6485123
Journal Information:
Physical Review, A (General Physics); (USA), Vol. 42:3; ISSN 0556-2791
Country of Publication:
United States
Language:
English