Risk assessment for heavy ions of parts tested with protons
Journal Article
·
· IEEE Transactions on Nuclear Science
- NASA Johnson Space Center, Houston, TX (United States)
An internuclear cascade-evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm{sup 2}/mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low earth orbit susceptibility to heavy ions.
- OSTI ID:
- 644224
- Report Number(s):
- CONF-970711-; ISSN 0018-9499; TRN: 98:008156
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 44, Issue 6Pt1; Conference: 34. IEEE nuclear and space radiation effects conference, Snowmass, CO (United States), 21-25 Jul 1997; Other Information: PBD: Dec 1997
- Country of Publication:
- United States
- Language:
- English
Similar Records
Internuclear cascade-evaporation model for LET spectra of 200 MeV protons used for parts testing
Proton-induced fragmentation of carbon at energies below 100 MeV
Comparisons of LET Distributions for Protons with Energies between50 and 200 MeV Determined Using a Spherical Tissue-EquivalentProportional Counter (TEPC) and a Position-Sensitive Silicon Spectrometer(RRMD-III)
Journal Article
·
Tue Dec 01 00:00:00 EST 1998
· IEEE Transactions on Nuclear Science
·
OSTI ID:644224
Proton-induced fragmentation of carbon at energies below 100 MeV
Conference
·
Sat Dec 31 00:00:00 EST 1994
·
OSTI ID:644224
+4 more
Comparisons of LET Distributions for Protons with Energies between50 and 200 MeV Determined Using a Spherical Tissue-EquivalentProportional Counter (TEPC) and a Position-Sensitive Silicon Spectrometer(RRMD-III)
Journal Article
·
Wed Dec 01 00:00:00 EST 2004
· Radiation Research
·
OSTI ID:644224
+8 more