Optical functions of uniaxial ZnO determined by generalized ellipsometry
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030 (United States)
The optical functions of uniaxial ZnO have been determined using two-modulator generalized ellipsometry, where a single measurement is sufficient to determine the optical functions from appropriately aligned uniaxial crystals. Above the direct band edge ({approximately}3.3thinspeV), this technique produces the most accurate values of the optical functions of ZnO presently available, while the refractive indices determined below the direct band edge agree with minimum-deviation methods. Near the direct band edge, the optical functions are modified by the excitonic interaction with a three-dimensional critical point. The optical dielectric response functions are fit to a recent formulation by Holden {ital et al.} [Phys. Rev. B {bold 56}, 4037 (1997)]. One isotropic point in the spectrum was observed at 3.114 eV, and a near-isotropic point near 3.31{endash}3.34 eV. {copyright} {ital 1998} {ital The American Physical Society}
- OSTI ID:
- 639833
- Journal Information:
- Physical Review, B: Condensed Matter, Vol. 58, Issue 7; Other Information: PBD: Aug 1998
- Country of Publication:
- United States
- Language:
- English
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