Mode selectivity study of vertical-cavity surface-emitting lasers

Journal Article · Sat Aug 01 00:00:00 EDT 1998 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.121981· OSTI ID:639154

Liu, G; Seurin, J; Chuang, S L ^[1]; Babic, D I; Corzine, S W; Tan, M ^[2]; Barnes, D C; Tiouririne, T N ^[3]

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1. Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
2. Hewlett-Packard Company, Palo Alto, California 94304-1392 (United States)
3. Applied Theoretical and Computational Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

Mode selectivity of an air-post index-guided vertical-cavity surface-emitting laser structure operating at 1550 nm is investigated using a full-vector Maxwell-equation solver with a finite-difference time-domain method. The resonance wavelengths, quality factors, and spatial field distributions are calculated for the three lowest-order modes. Transverse-mode competition is quantitatively described as a function of the cavity size and the pillar etch depth. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 639154
• Journal Information: Applied Physics Letters, Vol. 73, Issue 6; Other Information: PBD: Aug 1998
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
SEMICONDUCTOR LASERS
OPTICAL MODES
MAXWELL EQUATIONS
RESONANCE
QUALITY FACTOR
GALLIUM ARSENIDES
INDIUM PHOSPHIDES