Micrographic detection of plastic deformation in nickel base alloys

Patent · Tue May 01 00:00:00 EDT 1984

OSTI ID:6369295

Steeves, A F; Bibb, A E

A method for detecting low levels of plastic deformation in metal articles comprising electrolytically etching a flow free surface of the metal article with nital at a current density of less than about 0.1 amp/cm/sup 2/ and microscopically examining the etched surface to determine the presence of alternating striations. The presence of striations indicates plastic deformation in the article.

• Assignee: Dept. of Energy
• Patent Number(s): US 4445988
• Application Number: TRN: 84-022897
• OSTI ID: 6369295
• Resource Relation: Patent File Date: Filed date 29 Sep 1980; Other Information: PAT-APPL-426448
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
NICKEL BASE ALLOYS
DEFORMATION
PLASTICITY
CURRENT DENSITY
ETCHING
MATERIALS TESTING
MICROSCOPY
ALLOYS
MECHANICAL PROPERTIES
NICKEL ALLOYS
SURFACE FINISHING
TESTING
360103* - Metals & Alloys- Mechanical Properties