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Title: Nain geochemistry reviewed: anorthosite parent liquids and contamination problems

Conference · · Geol. Soc. Am., Abstr. Programs; (United States)
OSTI ID:6317067

Sr-An relations of PLAG and candidate natural LIQ (dikes, chills) agree with partition coefficients derived from Kiglapait in predicting parent LIQuids like rift basalts (Servilleta) and flood basalt (Keweenaw, Parana). All LIQ are richer in Sr than consistent with proposed lower crust or MORB. Many diverse parent LIQS had 275-675 ppm Sr, with mean 430 ppm Sr, 8 ppm Rb. Referred to 1.4 Gry, Archean crust (ARCH) at Lost Channel has I(Sr) = 0.717, R = Rb/Sr = 0.4. Minimum melt granites (GR) 2.3-1.3 Gyr old average Sr = 190, Rb = 160 ppm at I(Sr) = 0.753. By contrast, Nain feldspars have R from 0.001 to 0.01, implying liquids 0.003 - 0.02. Neither GR nor ARCH can contaminate normal mantle-derived magmas (I= 0.7028) to achieve the I(Sr) 0.703-0.708 observed, without adding 15-50 ppm Rb, not observed. Therefore, the I(Sr) signature is either from an old, enriched mantle source later depleted, or form assimilation of Rb-poor supracrustals (marble.) with huge I(Sr), ppm Sr values. The latter are not yet demonstrated to exist. Proximal contaminants should show up in local Sr-isotopic heterogeneity (as at Rhum). Local isotopic uniformity could arise for mold deeper-seated, multi-cycle or conceivably lower mantle source component, brought up in a rift setting and degassed with exit of LIL as per Galer and O'Nions (J. Petrol., submitted). Rb-rich GR of all ages show the regional persistence of undepleted crust available for melting. Either ANORTH plumbing was very restricted or new crustal slices of GR source were delivered to the hot spot on a regular basis to yield new GR melts.

Research Organization:
Univ. of Massachusetts, Amherst (USA)
OSTI ID:
6317067
Report Number(s):
CONF-8510489-
Journal Information:
Geol. Soc. Am., Abstr. Programs; (United States), Vol. 17; Conference: 98. annual meeting of the Geological Society of America, Orlando, FL, USA, 28 Oct 1985
Country of Publication:
United States
Language:
English