Low-energy x-ray response of photographic films. I. Mathematical models

Journal Article · Sat Dec 01 00:00:00 EST 1984 · J. Opt. Soc. Am. B: Opt. Phys.; (United States)

DOI:https://doi.org/10.1364/JOSAB.1.000818· OSTI ID:6171269

Henke, B L; Kwok, S L; Uejio, J Y; Yamada, H T; Young, G C

Relatively simple mathematical models are developed to determine the optical density as a function of the x-ray intensity, its angle of incidence, and its photon energy in the 100--10,000-eV region for monolayer and emulsion types of photographic films. Semiempirical relations are applied to characterize a monolayer film (Kodak 101-07) and an emilsion-type film (Kodak RAR 2497); these relations fit calibration data at nine photon energies well within typical experimental error.

• Research Organization: University of Hawaii, Honolulu, Hawaii 96822
• OSTI ID: 6171269
• Journal Information: J. Opt. Soc. Am. B: Opt. Phys.; (United States), Vol. 1:6
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
PHOTOGRAPHIC EMULSIONS
MATHEMATICAL MODELS
OPACITY
SPECTRAL RESPONSE
PHOTOGRAPHIC FILMS
X-RAY DETECTION
PHOTOGRAPHIC FILM DETECTORS
ABSORPTIVITY
AMPLITUDES
CALIBRATION
EFFICIENCY
INCIDENCE ANGLE
PHOTOSENSITIVITY
PLASMA DIAGNOSTICS
POSITION SENSITIVE DETECTORS
RADIANT FLUX DENSITY
SCANNING ELECTRON MICROSCOPY
SILVER BROMIDES
THEORETICAL DATA
X-RAY SPECTROMETERS
BROMIDES
BROMINE COMPOUNDS
COLLOIDS
DATA
DETECTION
DISPERSIONS
ELECTRON MICROSCOPY
EMULSIONS
FLUX DENSITY
HALIDES
HALOGEN COMPOUNDS
INFORMATION
MEASURING INSTRUMENTS
MICROSCOPY
NUMERICAL DATA
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATION DETECTION
RADIATION DETECTORS
SENSITIVITY
SILVER COMPOUNDS
SPECTROMETERS
TRANSITION ELEMENT COMPOUNDS
440300* - Miscellaneous Instruments- (-1989)