Millimeter-wave scanning surface resistance analyzer using a confocal resonator
- Conductus, Inc., Sunnyvale, CA (United States)
- Sandia National Labs., Albuquerque, NM (United States)
Millimeter-wave confocal resonators are used in a new, commercially available instrument to map the surface resistance of large area (2--4 inch diameter) superconducting thin films. Q-factors are measured from the reflection coefficient of the cavity formed by a spherical aluminum mirror and a planar conductor sitting at half the radius of curvature of the mirror. The surface resistance of the superconducting film is extracted from the measured Q values. Typical R{sub s} values of 20--40 m{Omega} are measured for high-quality 2 in. high-{Tc} superconducting thin films at 94 GHz and 77 K. Other capabilities of related instruments such as determining dielectric constants and loss tangents of a substrate, high-rf-power surface resistance measurement, etc. will be demonstrated and discussed.
- OSTI ID:
- 61249
- Report Number(s):
- CONF-940142-; ISBN 0-8194-1451-4; TRN: IM9526%%30
- Resource Relation:
- Conference: OE/LASE `94: conference on optics, electro-optics, and laser applications in science and engineering, Los Angeles, CA (United States), 22-29 Jan 1994; Other Information: PBD: 1994; Related Information: Is Part Of High {Tc} microwave superconductors and applications. Volume 2156; Hammond, R.B.; Withers, R.S. [eds.]; PB: 235 p.
- Country of Publication:
- United States
- Language:
- English
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