A high performance Josephson binary counter implemented in Nb and NbN technology

Conference · Fri Mar 01 00:00:00 EST 1991 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6093000

Kuo, F ^[1]; Whitely, S R

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1. Hypres, Inc., Elmsford, NY (United States)

This paper reports on a Josephson binary counter with nondestructive readout implemented and tested in both niobium and niobium nitride technology. Successful operation of the Nb version has been observed. The design incorporates an additional tapered edge SiO{sub 2} level in the Nb processing sequence, which increases interferometer inductance, decreases capacitance, and ensures that geometric resonances are as high in frequency as possible. This new level has the added advantage of providing mask compatibility with the NbN process, as this level is skipped in the NbN flow, thereby compensating in part for the larger penetration depth of NbN. The counter cell is designed to be as compact as possible to minimize stray inductance and maximize top count rate and high count rate bias margins low read SQUID inductance, and requires no holes in the ground plane.

• OSTI ID: 6093000
• Report Number(s): CONF-900944-; CODEN: IEMGA
• Journal Information: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Vol. 27:2; Conference: 1990 applied superconductivity conference, Snowmass, CO (United States), 24-28 Sep 1990; ISSN 0018-9464
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
INTERFEROMETERS
DESIGN
JOSEPHSON JUNCTIONS
SUPERCONDUCTIVITY
FLUX QUANTIZATION
CAPACITANCE
COUPLING
HOLES
INTEGRATED CIRCUITS
NIOBIUM NITRIDES
NONDESTRUCTIVE TESTING
PENETRATION DEPTH
SILICON OXIDES
SQUID DEVICES
CHALCOGENIDES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FLUXMETERS
JUNCTIONS
MATERIALS TESTING
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MICROWAVE EQUIPMENT
NIOBIUM COMPOUNDS
NITRIDES
NITROGEN COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
REFRACTORY METAL COMPOUNDS
SILICON COMPOUNDS
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS
TESTING
TRANSITION ELEMENT COMPOUNDS
665412* - Superconducting Devices- (1992-)
665411 - Basic Superconductivity Studies- (1992-)