Source distribution dependent scatter correction for PVI

Journal Article · Sun Aug 01 00:00:00 EDT 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.256701· OSTI ID:6011962

Barney, J S; Harrop, R; Dykstra, C J ^[1]

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1. Simon Fraser Univ., Burnaby, British Columbia (Canada). School of Computing Science TRIUMF, Vancouver, British Columbia (Canada)

Source distribution dependent scatter correction methods which incorporate different amounts of information about the source position and material distribution have been developed and tested. The techniques use image to projection integral transformation incorporating varying degrees of information on the distribution of scattering material, or convolution subtraction methods, with some information about the scattering material included in one of the convolution methods. To test the techniques, the authors apply them to data generated by Monte Carlo simulations which use geometric shapes or a voxelized density map to model the scattering material. Source position and material distribution have been found to have some effect on scatter correction. An image to projection method which incorporates a density map produces accurate scatter correction but is computationally expensive. Simpler methods, both image to projection and convolution, can also provide effective scatter correction.

• OSTI ID: 6011962
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:4 part 1; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

62 RADIOLOGY AND NUCLEAR MEDICINE
POSITRONS
IMAGE PROCESSING
SCATTERING
CORRECTIONS
MONTE CARLO METHOD
RADIATION SOURCES
SPATIAL DISTRIBUTION
ANTILEPTONS
ANTIMATTER
ANTIPARTICLES
CALCULATION METHODS
DISTRIBUTION
ELEMENTARY PARTICLES
FERMIONS
LEPTONS
MATTER
PROCESSING
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