Charging and discharging characteristics of dielectric materials exposed to low- and mid-energy electrons

Journal Article · Wed Dec 01 00:00:00 EST 1982 · IEEE Trans. Nucl. Sci.; (United States)

DOI:https://doi.org/10.1109/TNS.1982.4336419· OSTI ID:5961080

Coakley, P; Kitterer, B; Treadaway, M

Samples of dielectric materials have been irradiated with low- (1 to 25 keV) and mid-energy (25 to 100 keV) electrons. Charging and discharging characteristics for samples of OSR, mylar, Kapton, perforated Kapton and Alphaquartz are discussed. Results of tests conducted with monoenergetic midenergy electrons indicate that the worst-case peak discharge current, l /SUB s/ , is relatively constant with exposure energy; that dl /SUB s/ /dt is relatively constant with exposure energy; and that the predischarge surface potential, V /SUB i/ , is only a weak function of energy. Results of irradiating samples of OSR, mylar, and Kapton with low-energy and mid-energy electrons indicate that the surface potential may be tailored to low values (V /SUB s/ <2 kV) and yet still achieve discharges (on OSR and mylar samples), and that for an OSR sample, the frequency content of these discharges is much higher than for discharges observed during exposure to monoenergetic low-energy electrons alone.

• Research Organization: JAYCOR, San Diego, CA
• OSTI ID: 5961080
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Vol. 29:6
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIELECTRIC MATERIALS
PHYSICAL RADIATION EFFECTS
MYLAR
QUARTZ
ELECTRONS
IRRADIATION
PEAK LOAD
POTENTIALS
RADIATION DOSES
REACTOR FUELING
CHALCOGENIDES
DOSES
ELEMENTARY PARTICLES
ESTERS
FERMIONS
LEPTONS
MATERIALS
MINERALS
ORGANIC COMPOUNDS
ORGANIC POLYMERS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
POLYESTERS
POLYMERS
RADIATION EFFECTS
SILICON COMPOUNDS
SILICON OXIDES
SYNTHETIC MATERIALS
360605* - Materials- Radiation Effects
440200 - Radiation Effects on Instrument Components
Instruments
or Electronic Systems