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Title: Electrodeposition of CdTe thin films

Journal Article · · J. Electrochem. Soc.; (United States)
DOI:https://doi.org/10.1149/1.2116014· OSTI ID:5955052

Cadmium telluride thin films were fabricated on Ti and Nesatron substrates by electrodeposition and characterized by x-ray diffraction, scanning electron microscopy, energy dispersive x-ray analyses (EDAX), optical transmission measurements, and photoelectrochemical (PEC) studies. The deposition-bath preparation procedure was slightly modified from the literature method to permit initial speciation of TeO/sub 2/ and thereby increase the loading level of Te in the film. New data are presented on the electrochemistry of the deposition process and on the cyclic voltammetric behavior of TeO/sub 2/ containing electrolytes in the pH range from about 0.7 to 11.0. The films after suitable annealing in an Ar atmosphere show x-ray diffraction behavior consistent with a hexagonal structure. Data from EDAX show that the Cd/Te ratio in the film is sensitive to the annealing process. Concomitantly, the conductivity also changes from p-type to n-type, as shown by PEC measurements on the films containing a protective ..cap alpha..-PbO/sub 2/ coating in contact with alkaline polysulfide electrolytes. Finally, some preliminary data are presented on PEC cells based on these CdTe thin films in a nonaqueous electrolyte system comprising the ferrocene/ferricenium ion redox couple.

Research Organization:
Department of Chemistry, The University of Texas at Arlington, Arlington, Texas
OSTI ID:
5955052
Journal Information:
J. Electrochem. Soc.; (United States), Vol. 131:9
Country of Publication:
United States
Language:
English