Pulsed operation of a superconductive electromagnetic gradiometer

Conference · Fri Mar 01 00:00:00 EST 1991 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:5922709

Czipott, P V; Podney, W N ^[1]

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1. SQM Technology, Inc., La Jolla, CA (US)

This paper reports on an electromagnetic gradiometer (EMG) which combines a superconducting quantum interference device (SQUID) gradiometer with an active magnetic source for use as an ultrasensitive metal detector. The source drives electrical eddy currents in conductive targets, and the gradiometer detects the magnetic gradient of the induced currents. In earlier work, we demonstrated performance using a sinusoidally oscillating source. Here we report first performance tests of an EMG configuration using a pulsed source. Eddy currents persist in metallic targets between pulses and so make them visible to the receiver. Because the receiver only looks between pulses, when the source is off, it is immune to noise from source interference.

• OSTI ID: 5922709
• Report Number(s): CONF-900944-; CODEN: IEMGA
• Journal Information: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Vol. 27:2; Conference: 1990 applied superconductivity conference, Snowmass, CO (United States), 24-28 Sep 1990; ISSN 0018-9464
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
42 ENGINEERING
47 OTHER INSTRUMENTATION
METALS
EDDY CURRENT TESTING
SQUID DEVICES
TECHNOLOGY UTILIZATION
ANALYTICAL SOLUTION
ELECTRON EMISSION
FLUX QUANTIZATION
INTERNAL ELECTROMAGNETIC PULSES
MAGNETIC FLUX
MEASURING INSTRUMENTS
NONDESTRUCTIVE TESTING
PULSE GENERATORS
ELECTROMAGNETIC PULSES
ELECTROMAGNETIC RADIATION
ELECTROMAGNETIC TESTING
ELECTRONIC EQUIPMENT
ELEMENTS
EMISSION
EQUIPMENT
FLUXMETERS
FUNCTION GENERATORS
MATERIALS TESTING
MICROWAVE EQUIPMENT
PULSES
RADIATIONS
SUPERCONDUCTING DEVICES
TESTING
665412* - Superconducting Devices- (1992-)
420500 - Engineering- Materials Testing
440800 - Miscellaneous Instrumentation- (1990-)