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Title: High critical current densities in YBa sub 2 Cu sub 3 O sub 7 minus x thin films formed by metalorganic chemical vapor deposition at 730 degree C

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.104557· OSTI ID:5876940
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  1. EMCORE Corporation, 35 Elizabeth Avenue, Somerset, New Jersey 08873 (US)

YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} superconducting thin films with a critical current density of 2.3{times}10{sup 6} A/cm{sup 2} at 77.7 K and 0 T were prepared by a metalorganic chemical vapor deposition process. The films were formed {ital in} {ital situ} on LaAlO{sub 3} at a substrate temperature of 730 {degree}C in 2 Torr partial pressure of N{sub 2}O. Resistivity and magnetic susceptibility measurements of the as-deposited films show a sharp superconducting transition temperature of 89 K with a narrow width of less than 1 K. Critical current densities were measured by the dc transport method with a patterned bridge of 120 {mu}m{times}40 {mu}m. Both x-ray diffraction and high-resolution electron microscopy measurements indicate that films grew epitaxially with the {ital c} axis perpendicular to the surface of the substrate.

OSTI ID:
5876940
Journal Information:
Applied Physics Letters; (USA), Vol. 58:6; ISSN 0003-6951
Country of Publication:
United States
Language:
English