X-ray spectrometry
In the period under review, i.e, through 1984 and 1985, some 600 articles on XRS (X-ray spectrometry) were published; most of these have been scanned and the most fundamental ones are discussed. All references will refer to English-language articles, unless states otherwise. Also general books have appeared on quantitative EPXMA (electron-probe X-ray microanalysis) and analytical electron microscopy (AEM) as well as an extensive review on the application of XRS to trace analysis of environmental samples. In the period under review no radically new developments have been seen in XRS. However, significant improvements have been made. Gain in intensities has been achieved by more efficient excitation, higher reflectivity of dispersing media, and better geometry. Better understanding of the physical process of photon- and electron-specimen interactions led to complex but more accurate equations for correction of various interelement effects. Extensive use of micro- and minicomputers now enables fully automatic operation, including qualitative analysis. However, sample preparation and presentation still put a limit to further progress. Although some authors find XRS in the phase of stabilization or even stagnation, further gradual developments are expected, particularly toward more dedicated equipment, advanced automation, and image analysis systems. Ways are outlined in which XRS has been improved in the 2 last years by excitation, detection, instrumental, methodological, and theoretical advances. 340 references.
- Research Organization:
- Univ. of Antwerp (UIA), Antwerp-Wilrijk, Belgium
- OSTI ID:
- 5819403
- Journal Information:
- Anal. Chem.; (United States), Vol. 58:5
- Country of Publication:
- United States
- Language:
- English
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ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
X-RAY SPECTROSCOPY
REVIEWS
USES
ELECTRON MICROPROBE ANALYSIS
ENVIRONMENTAL MATERIALS
EXCITED STATES
PIXE ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
TRACE AMOUNTS
X-RAY FLUORESCENCE ANALYSIS
CHEMICAL ANALYSIS
DOCUMENT TYPES
ENERGY LEVELS
MATERIALS
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
SPECTROSCOPY
X-RAY EMISSION ANALYSIS
400103* - Radiometric & Radiochemical Procedures- (-1987)