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Title: Thermal conductance of pressed contacts at liquid helium temperatures

Abstract

The thermal contact conductance of a 0.4 micrometer surface finish OFHC copper sample pair has been investigated from 1.6 to 3.8 K for a range of applied contact forces up to 670 N. Experimental data have been fitted to the relation for the integral alpha T to the nth power dt by assuming that the thermal contact conductance is a simple power function of the sample temperature. It has been found that the conductance is proportional to T squared and that conductance increases with an increase in applied contact force. These results confirm earlier work.

Authors:
; ;
Publication Date:
Research Org.:
National Aeronautics and Space Administration, Moffett Field, CA (USA). Ames Research Center
OSTI Identifier:
5718748
Report Number(s):
N-8327876; NASA-TM-84365
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ELECTRIC CONTACTS; THERMAL CONDUCTIVITY; COPPER; CRYOGENICS; ELECTRIC POTENTIAL; SUPERCONDUCTIVITY; TEMPERATURE DEPENDENCE; ULTRALOW TEMPERATURE; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; EQUIPMENT; METALS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS; 420201* - Engineering- Cryogenic Equipment & Devices

Citation Formats

Salerno, L J, Kittel, P, and Spivak, A L. Thermal conductance of pressed contacts at liquid helium temperatures. United States: N. p., 1983. Web.
Salerno, L J, Kittel, P, & Spivak, A L. Thermal conductance of pressed contacts at liquid helium temperatures. United States.
Salerno, L J, Kittel, P, and Spivak, A L. 1983. "Thermal conductance of pressed contacts at liquid helium temperatures". United States.
@article{osti_5718748,
title = {Thermal conductance of pressed contacts at liquid helium temperatures},
author = {Salerno, L J and Kittel, P and Spivak, A L},
abstractNote = {The thermal contact conductance of a 0.4 micrometer surface finish OFHC copper sample pair has been investigated from 1.6 to 3.8 K for a range of applied contact forces up to 670 N. Experimental data have been fitted to the relation for the integral alpha T to the nth power dt by assuming that the thermal contact conductance is a simple power function of the sample temperature. It has been found that the conductance is proportional to T squared and that conductance increases with an increase in applied contact force. These results confirm earlier work.},
doi = {},
url = {https://www.osti.gov/biblio/5718748}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun May 01 00:00:00 EDT 1983},
month = {Sun May 01 00:00:00 EDT 1983}
}

Technical Report:
Other availability
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