Upper-bound SEU rate for devices in an isotropic or nonisotropic flux

Technical Report · Thu Aug 01 00:00:00 EDT 1991

OSTI ID:5694147

Edmonds, L D

A method for constructing upper bound estimates for device single event upset (SEU) rates is presented. A directional Heinrich flux, as a function of direction, must be known. A computer code, included, converts the directional Heinrich flux into an 'effective flux'. The effective flux provides a simple way to estimate upper bound SEU rates for devices with a known normal incident cross section versus LET curve.

• Research Organization: California Institute of Technology (CalTech), Pasadena, CA (United States). Jet Propulsion Lab. (JPL)
• OSTI ID: 5694147
• Report Number(s): N-92-16725; NASA-CR-189765; JPL-PUBL-91-32; NAS-1.26:189765
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC EQUIPMENT
PHYSICAL RADIATION EFFECTS
CHARGED PARTICLES
COMPUTER CODES
ENERGY TRANSFER
FAILURES
ISOTROPY
LIMITING VALUES
MATHEMATICAL MODELS
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440200* - Radiation Effects on Instrument Components
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