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Title: Diffusion of electronic defects in calcia-stabilized zirconia from a desorption rate study

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2086250· OSTI ID:5645538
 [1];  [2];  [3]
  1. Dept. of Materials Science and Engineering, Univ. of New South Wales, Kensington (AU)
  2. Atlantic Research Lab., National Research Council, Halifax, Nova Scotia, B3H 3Z1 (CA)
  3. Dept. of Chemistry, Dalhousie Univ., Halifax, Nova Scotia, B3H 4J3 (CA)

This paper reports on rates of desorption of oxygen from samples of calcis-stabilized zirconia (CSZ) measured as a function of oxygen saturation pressure, of temperature, and of the impurity content of CSZ. The results have been interpreted to determine the diffusion coefficient, {ital D}, for electronic defects in CSZ. {ital D} was independent of the oxygen saturation pressure from 0.5 to 101 kPa. The activation energy was 88 kJ/mol for one sample from 1228 to 1577 K and 113 kJ/mol for another from 1515 to 1667 K. {ital D} was inversely proportional to the iron impurity concentration in the CSZ. This observation was interpreted in terms of a mechanism in which electron holes were trapped by iron impurity sites.

OSTI ID:
5645538
Journal Information:
Journal of the Electrochemical Society; (United States), Vol. 137:11; ISSN 0013-4651
Country of Publication:
United States
Language:
English