HPM (high power microwave) testing of electronic components

Technical Report · Wed May 10 00:00:00 EDT 1989

OSTI ID:5634446

Ng, W C

This report documents the results of a study of high power microwave (HPM) vulnerability of electronic components commonly used in weapon systems. The study was carried out at the Lawrence Livermore National Laboratory from August through October 1988. The objective of this study was to determine the threshold levels for upset or disturbance and damage of the devices under test (DUT). In these tests pulsed microwave energy was directly injected into the terminal of the DUT and in most cases a 50-ohm microstrip test fixture was used to ensure that 50-ohm transmission was maintained as close to the DUT as possible. 3 refs., 41 figs., 10 tabs.

• Research Organization: Lawrence Livermore National Lab., CA (USA)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5634446
• Report Number(s): UCID-21687; ON: DE89016682
• Resource Relation: Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC EQUIPMENT
VULNERABILITY
DESTRUCTIVE TESTING
ELECTRONIC CIRCUITS
FLOWSHEETS
MICROWAVE RADIATION
WEAPONS
DIAGRAMS
ELECTROMAGNETIC RADIATION
EQUIPMENT
MATERIALS TESTING
RADIATIONS
TESTING
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems