Flash x-ray test of the CMOS/SOS SCP-STAR ALU

Journal Article · Sat Dec 01 00:00:00 EST 1984 · IEEE Trans. Nucl. Sci.; (United States)

DOI:https://doi.org/10.1109/TNS.1984.4333555· OSTI ID:5619930

Brucker, G J; Kertesz, C; Miller, M; Oey, K K

This paper reports on the measurement of the x-ray upset dose rate for a subsystem which was designed to represent the ALU part of the SCP-STAR spacecraft computer. This computer was fabricated totally with radhard, CMOS/SOS devices. The test was conducted at the OWL flash x-ray facility of Physics International. The results showed that the upset dose rate for the subsystem was 9.8 x 10/sup 10/ and 1.7 x 10/sup 11/ rads(Si)/s during dynamic and static modes of operation, respectively. Subsystem interactions did not compromise the upset levels of the discrete components.

• Research Organization: RCA Astro-Electronics, P.O. Box 800, Princeton, New Jersey 08540
• OSTI ID: 5619930
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Vol. NS-31:6
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERS
PHYSICAL RADIATION EFFECTS
SPACE VEHICLES
DOSE RATES
MOS TRANSISTORS
OPERATION
X RADIATION
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
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440200* - Radiation Effects on Instrument Components
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