PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation

Williams, E T; Finston, H L

Title: PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation

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Abstract

A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given.

Authors:: Williams, E T; Finston, H L

Publication Date:: Wed Apr 01 00:00:00 EST 1981

Research Org.:: City University of New York, Brooklyn College, Brooklyn, New York 11210

OSTI Identifier:: 5597245

Report Number(s):: CONF-801111-
Journal ID: CODEN: IETNA; TRN: 84-001491

DOE Contract Number:: AC02-76ER03126

Resource Type:: Conference

Journal Name:: IEEE Trans. Nucl. Sci.; (United States)

Additional Journal Information:: Journal Volume: NS-28:2; Conference: 6. conference on application of accelerators in research and industry, Denton, TX, USA, 3 Nov 1980

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; HELIUM; PIXE ANALYSIS; SAMPLE PREPARATION; CORALS; PROTON BEAMS; SEA BED; SEDIMENTS; BEAMS; CHEMICAL ANALYSIS; CNIDARIA; ELEMENTS; FLUIDS; GASES; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; RARE GASES; X-RAY EMISSION ANALYSIS; 400103* - Radiometric & Radiochemical Procedures- (-1987)

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                    Williams, E T, and Finston, H L. PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation.  United States: N. p., 1981. 
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                    Williams, E T, & Finston, H L. PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation.  United States.

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                    Williams, E T, and Finston, H L. 1981.  
        "PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation".  United States.

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@article{osti_5597245,

  title        = {PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation},

  author       = {Williams, E T and Finston, H L},

  abstractNote = {A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given.},

  doi          = {},

  url          = {https://www.osti.gov/biblio/5597245},
  journal      = {IEEE Trans. Nucl. Sci.; (United States)},
number       = ,

  volume       = NS-28:2,

  place        = {United States},

  year         = {Wed Apr 01 00:00:00 EST 1981},

  month        = {Wed Apr 01 00:00:00 EST 1981}

}

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