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Title: High-voltage pulsed life of multistressed polypropylene capacitor dielectric

Journal Article · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/23.120131· OSTI ID:5566960
 [1]
  1. Dept. of Electrical and Computer Engineering, State Univ. of New York, Buffalo, NY (US)

High-voltage polypropylene capacitors were aged under singular as well as simultaneous multiple stresses (electrical, thermal, and radiation) at the University of Buffalo's 2 MW thermal nuclear reactor. These stresses were combined neutron-gamma radiation with a total dose of 1.6 {times} 10{sup 6} rad, electrical stress at 40 V{sub rms}/{mu}m, and thermal stress at 90{degrees} C. After exposure, the polypropylene dielectric was tested for life (number of pulses to fail) under high-voltage high-repetition-rate (100 pps) pulses. Pulsed life data were also compared with ac life data. Results show that radiation stress causes the most degradation in life, either acting alone or in combination with other stresses. The largest reduction in life occurs when polypropylene is aged under simultaneous multiple stresses (electrical, thermal, and radiation). In this paper, it is shown that pulsed life can be equivalently compared with ac life.

OSTI ID:
5566960
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 39:1; ISSN 0018-9499
Country of Publication:
United States
Language:
English