SEU immune ICs for project Galileo

Conference · Tue Jan 01 00:00:00 EST 1985

OSTI ID:5557221

Giddings, A E; Hewlett, F W; Treece, R K; Nichols, D K; Smith, L S; Zoutendyk, J A

Tests showed that bipolar chips in the attitude control computer of the Galileo spacecraft would likely cause catastrophic mission failure due to single particle upset. This paper describes the design and testing of CMOS replacements which are speed compatible with the bipolar parts and are immune to upset by 165-MeV krypton ions.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA); Jet Propulsion Lab., Pasadena, CA (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5557221
• Report Number(s): SAND-85-0560C; CONF-850711-9; ON: DE85013785
• Resource Relation: Conference: 22. annual conference on nuclear and space radiation effects, Monterey, CA, USA, 22 Jul 1985
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
SPACE VEHICLES
ATTITUDE CONTROL
COMPUTERIZED CONTROL SYSTEMS
CONTROL
ELECTRONIC GUIDANCE
INTEGRATED CIRCUITS
KRYPTON IONS
LET
MEV RANGE 100-1000
MOS TRANSISTORS
CHARGED PARTICLES
CONTROL SYSTEMS
ELECTRONIC CIRCUITS
ENERGY RANGE
ENERGY TRANSFER
IONS
MEV RANGE
MICROELECTRONIC CIRCUITS
SEMICONDUCTOR DEVICES
TRANSISTORS
VEHICLES
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems