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Title: A new method to do time resolved, x-ray diffraction studies: The rotating crystal Laue method

Conference ·
OSTI ID:5511963

In order to achieve the ultimate time resolution of a synchrotron source we propose a new experimental technique by which time dependent structural changes can be monitored on the time scale of synchrotron pulse widths. Samples will be studied by a rotating crystal Laue diffraction technique where we rapidly spin the sample and observe the diffraction pattern from a broad band of incident x-rays. A computer simulation is presented of the diffraction pattern time evolution using the parameters for an APS undulator of a phase change in the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} superconductor. We will discuss the application of this and closely related techniques at other synchrotron sources including bending magnets and insertion devices at NSLS and CHESS. 11 refs., 4 figs., 1 tab.

Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5511963
Report Number(s):
ANL/CP-72869; CONF-910730-2; ON: DE91016527
Resource Relation:
Conference: 4. international conference on synchrotron radiation instrumentation, Manchester (United Kingdom), 15-19 Jul 1991
Country of Publication:
United States
Language:
English