Acceleration transforms and statistical kinetic models

Journal Article · Fri Jul 01 00:00:00 EDT 1988 · Journal of Statistical Physics; (USA)

DOI:https://doi.org/10.1007/BF01016417· OSTI ID:5504476

LuValle, M J; Welsher, T L; Svoboda, K ^[1]

---

1. AT and T Bell Labs., Whippany, NJ (USA)

For a restricted class of problems a mathematical model of microscopic degradation processes, statistical kinetics, is developed and linked through acceleration transforms to the information which can be obtained from a system in which the only observable sign of degradation is sudden and catastrophic failure. The acceleration transforms were developed in accelerated life testing applications as a tool for extrapolating from the observable results of an accelerated life test to the dynamics of the underlying degradation processes. A particular concern of a physicist attempting to interpreted the results of an analysis based on acceleration transforms is determining the physical species involved in the degradation process. These species may be (a) relatively abundant or (b) relatively rare. The main results of this paper are a theorem showing that for an important subclass of statistical kinetic models, acceleration transforms cannot be used to distinguish between cases a and b, and an example showing that in some cases falling outside the restrictions of the theorem, cases a and b can be distinguished by their acceleration transforms.

• OSTI ID: 5504476
• Journal Information: Journal of Statistical Physics; (USA), Vol. 52:1-2; ISSN 0022-4715
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
42 ENGINEERING
MATERIALS TESTING
STATISTICAL MODELS
CRACK PROPAGATION
DEFECTS
FAILURE MODE ANALYSIS
FAILURES
INTEGRATED CIRCUITS
KINETICS
MEASURE THEORY
PROBABILITY
QUANTUM MECHANICS
RADIATION EFFECTS
SERVICE LIFE
STOCHASTIC PROCESSES
TRANSFORMATIONS
ELECTRONIC CIRCUITS
MATHEMATICAL MODELS
MATHEMATICS
MECHANICS
MICROELECTRONIC CIRCUITS
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING
657002* - Theoretical & Mathematical Physics- Classical & Quantum Mechanics
420500 - Engineering- Materials Testing