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Title: Some computational aspects of the hals (harmonic analysis of x-ray line shape) method

Abstract

This paper discusses the problem of distinguishing the analytical line from the background and approximates the background component. One of the constituent parts of the program package in the procedural-mathematical software for x-ray investigations of polycrystalline substances in application to the DRON-3, DRON-2 and ADP-1 diffractometers is the SSF system of programs, which is designed for determining the parameters of the substructure of materials. The SSF system is tailored not only to Unified Series (ES) computers, but also to the M-6000 and SM-1 minicomputers.

Authors:
;
Publication Date:
Research Org.:
Burevestnik Sci-Res Union, Leningrad
OSTI Identifier:
5499228
Resource Type:
Journal Article
Journal Name:
Ind. Lab. (Engl. Transl.); (United States)
Additional Journal Information:
Journal Volume: 51:8
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; POLYCRYSTALS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; ON-LINE SYSTEMS; PROGRAMMING; CRYSTAL STRUCTURE; ES COMPUTERS; FOURIER TRANSFORMATION; GERMANIUM; HARMONICS; IMAGE PROCESSING; SEMICONDUCTOR MATERIALS; SPATIAL RESOLUTION; STRUCTURAL CHEMICAL ANALYSIS; COHERENT SCATTERING; COMPUTERS; CRYSTALS; DIFFRACTION; DIFFRACTOMETERS; ELEMENTS; INTEGRAL TRANSFORMATIONS; MATERIALS; MEASURING INSTRUMENTS; METALS; OSCILLATIONS; PROCESSING; RESOLUTION; SCATTERING; TRANSFORMATIONS; 360602* - Other Materials- Structure & Phase Studies

Citation Formats

Moshkina, T I, and Nakhmanson, M S. Some computational aspects of the hals (harmonic analysis of x-ray line shape) method. United States: N. p., 1986. Web.
Moshkina, T I, & Nakhmanson, M S. Some computational aspects of the hals (harmonic analysis of x-ray line shape) method. United States.
Moshkina, T I, and Nakhmanson, M S. 1986. "Some computational aspects of the hals (harmonic analysis of x-ray line shape) method". United States.
@article{osti_5499228,
title = {Some computational aspects of the hals (harmonic analysis of x-ray line shape) method},
author = {Moshkina, T I and Nakhmanson, M S},
abstractNote = {This paper discusses the problem of distinguishing the analytical line from the background and approximates the background component. One of the constituent parts of the program package in the procedural-mathematical software for x-ray investigations of polycrystalline substances in application to the DRON-3, DRON-2 and ADP-1 diffractometers is the SSF system of programs, which is designed for determining the parameters of the substructure of materials. The SSF system is tailored not only to Unified Series (ES) computers, but also to the M-6000 and SM-1 minicomputers.},
doi = {},
url = {https://www.osti.gov/biblio/5499228}, journal = {Ind. Lab. (Engl. Transl.); (United States)},
number = ,
volume = 51:8,
place = {United States},
year = {Sat Feb 01 00:00:00 EST 1986},
month = {Sat Feb 01 00:00:00 EST 1986}
}