Modeling and simulation of interactions of transient ionizing radiation with electronics

Conference · Fri Jan 01 00:00:00 EST 1988 · Transactions of the American Nuclear Society; (USA)

OSTI ID:5480541

Ishaque, A N; Howard, J W; Becker, M; Block, R C

Electronic devices frequently are designed to withstand environments in which transient ionizing radiation may be present. Devices so designed must be tested to determine whether they indeed can withstand such radiation. Electron linear accelerators, including Rensselaer Polytechnic Institute's (RPI) Linac, are used for such testing. To understand the interactions that take place, it is desirable to model and simulate the phenomena involved. At RPI, there is an ongoing effort in modeling and simulation to complement and support the experimental program at the Linac. Modeling and simulation at RPI is directed toward predicting the types of radiation effects that occur when transient measurements are made at the RPI Linac. The combination of device and circuit modeling provides both insight and confidence in the merits of the models developed.

• OSTI ID: 5480541
• Report Number(s): CONF-880601-; CODEN: TANSA; TRN: 89-027819
• Journal Information: Transactions of the American Nuclear Society; (USA), Vol. 56; Conference: American Nuclear Society annual meeting, San Diego, CA (USA), 12-16 Jun 1988; ISSN 0003-018X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
COMPUTERIZED SIMULATION
IONIZING RADIATIONS
LINEAR ACCELERATORS
MATHEMATICAL MODELS
S CODES
TESTING
TRANSIENTS
ACCELERATORS
COMPUTER CODES
RADIATION EFFECTS
RADIATIONS
SIMULATION
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems