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Title: Deuterium trapping by impurities in copper

Journal Article · · J. Vac. Sci. Technol.; (United States)
DOI:https://doi.org/10.1116/1.571539· OSTI ID:5458194

The addition of Er, Zr, or Ti to copper provides trapping sites for hydrogen isotopes, which causes the apparent diffusivity of hydrogen to take on values that are smaller than its normal diffusivity in pure copper. This apparent diffusivity can be described in terms of the dopant concentration and the binding energy of the hydrogen isotope to the traps. Criteria are met that enable the results of permeation breakthrough measurements, which were made between 300/sup 0/ and 700 /sup 0/C, to be extrapolated to room temperature. The resultant lag-time for deuterium breakthrough for a 0.25-mm-thick membrane of Cu containing 0.88 at.% Er, for example, exceeds 1000 years at 25 /sup 0/C. Therefore, this alloy is suitable for use in vacuum enclosures where it is necessary to restrict hydrogen permeation for long periods of time. Thermodesorption measurements for samples that were exposed to deuterium reveal that there are two types of traps in these alloys, and demonstrate that deuterium-to-dopant atomic ratios approaching two can be obtained.

Research Organization:
Applied Physics Division, 2563, Sandia National Laboratories, Albuquerque, New Mexico 87185
OSTI ID:
5458194
Journal Information:
J. Vac. Sci. Technol.; (United States), Vol. 20:4
Country of Publication:
United States
Language:
English