Direct measurement of potential steps at grain boundaries in the presence of current flow
Journal Article
·
· Phys. Rev. Lett.; (United States)
We have used a new technique to measure simultaneously the surface topography and surface potential of current-carrying polycrystalline Au/sub 60/Pd/sub 40/ thin films using a scanning tunneling microscope. The variations of the gradients of the surface potential from a macroscopically constant value which are associated with scattering from grain boundaries in these films are observed. We find that the local potential changes abruptly at the boundaries between the grains.
- Research Organization:
- IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
- OSTI ID:
- 5452111
- Journal Information:
- Phys. Rev. Lett.; (United States), Vol. 60:15
- Country of Publication:
- United States
- Language:
- English
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