Techniques to maximize software reliability in radiation fields

Journal Article · Fri Aug 01 00:00:00 EDT 1986 · IEEE Trans. Nucl. Sci.; (United States)

DOI:https://doi.org/10.1109/TNS.1986.4334544· OSTI ID:5449282

Eichhorn, G; Piercey, R B

Microprocessor system failures due to memory corruption by single event upsets (SEUs) and/or latch-up in RAM or ROM memory are common in environments where there is high radiation flux. Traditional methods to harden microcomputer systems against SEUs and memory latch-up have usually involved expensive large scale hardware redundancy. Such systems offer higher reliability, but they tend to be more complex and non-standard. At the Space Astronomy Laboratory the authors have developed general programming techniques for producing software which is resistant to such memory failures. These techniques, which may be applied to standard off-the-shelf hardware, as well as custom designs, include an implementation of Maximally Redundant Software (MRS) model, error detection algorithms and memory verification and management.

• Research Organization: Space Astronomy Lab., Univ. of Florida, 1810 NW 6th Street, Gainesville, FL 32609
• OSTI ID: 5449282
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Vol. NS-33:4
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
FAULT TOLERANT COMPUTERS
COMPUTER CODES
MICROPROCESSORS
PHYSICAL RADIATION EFFECTS
ALGORITHMS
ERRORS
INFORMATION VALIDATION
MEMORY DEVICES
PROGRAMMING
RADIATION FLUX
RELIABILITY
COMPUTERS
DIGITAL COMPUTERS
ELECTRONIC CIRCUITS
MATHEMATICAL LOGIC
MICROELECTRONIC CIRCUITS
RADIATION EFFECTS
TESTING
VALIDATION
990200* - Mathematics & Computers
440200 - Radiation Effects on Instrument Components
Instruments
or Electronic Systems