Scanning x-ray microscope
A scanning x-ray microscope is described including: an x-ray source capable of emitting a beam of x-rays; a collimator positioned to receive the beam of x-rays and to collimate this beam, a focusing cone means to focus the beam of x-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of x-rays, and x-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused x-ray beam across the specimen. A detector is disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of x-rays to provide an electrical output representative of this detection. Means are included for displaying and/or recording the information provided by the output from the detector, as are means for providing information to the recording and/or display means representative of the scan rate and position of the focused x-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an x-ray beam modulation means upstream, relative to the direction of emission of the xray beam, of the focusing cone means.
- Assignee:
- EDB-82-115694
- Patent Number(s):
- US 4317036
- Application Number:
- TRN: 82-013870
- OSTI ID:
- 5406636
- Resource Relation:
- Patent File Date: Filed date 11 Mar 1980; Other Information: PAT-APPL-129287
- Country of Publication:
- United States
- Language:
- English
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MICRORADIOGRAPHY
IMAGE SCANNERS
X-RAY EQUIPMENT
BEAM DYNAMICS
COLLIMATORS
DISPLAY DEVICES
GAMMA DETECTION
MICROSCOPES
RADIATION DETECTORS
X-RAY SOURCES
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RADIATION DETECTION
RADIATION SOURCES
440300* - Miscellaneous Instruments- (-1989)