Probabilistic description of particle transport. II. Analysis of low-energy electron transmission through thin solid Xe and N/sub 2/ films

Journal Article · Tue Mar 15 00:00:00 EST 1988 · Phys. Rev. A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.37.2183· OSTI ID:5400476

Keszei, E; Goulet, T; Jay-Gerin, J

The probabilistic description of quasielastic particle transport given in a previous paper is used to analyze the results of low-energy electron transmission experiments on thin solid xenon and molecular nitrogen films deposited on a metal substrate. Values of the entrance probabilities of the incident electrons at the vacuum-film interface and of the electron scattering mean free paths in the films are extracted in the electron energy range 1.6--7.9 eV for xenon, and 2.4--7.4 eV for molecular nitrogen. The effects of anisotropy in the surface scattering and in the reflections at the two interfaces of the films are also discussed.

• Research Organization: Departement de Medecine Nucleaire et de Radiobiologie, Faculte de Medecine, Universite de Sherbrooke, Sherbrooke, Quebec, Canada J1H5N4
• OSTI ID: 5400476
• Journal Information: Phys. Rev. A; (United States), Vol. 37:6
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
ELECTRONS
TRANSMISSION
NITROGEN
CHARGED-PARTICLE TRANSPORT
XENON
EV RANGE 01-10
FILMS
INTERFACES
MEAN FREE PATH
SOLIDS
ELEMENTARY PARTICLES
ELEMENTS
ENERGY RANGE
EV RANGE
FERMIONS
FLUIDS
GASES
LEPTONS
NONMETALS
RADIATION TRANSPORT
RARE GASES
654001* - Radiation & Shielding Physics- Radiation Physics
Shielding Calculations & Experiments