EXAFS study of copper-hafnium multilayers

Conference · Wed Jan 01 00:00:00 EST 1986

OSTI ID:5337839

Heald, S M; Tranquada, J M; Clemens, B M; Stec, J P

EXAFS measurements have been made on a number of Cu-Hf multilayers with modulation wavelengths of 1/2 to 20 close-packed monolayers. Clear indications are found for an amorphous interfacial compound. Fitting of the EXAFS spectra indicate that the interfacial regions are about 8 to 10 layers thick, and contain nearly equal numbers of layers of Hf and Cu. Results are compared to x-ray diffraction studies of the same samples.

• Research Organization: Brookhaven National Lab., Upton, NY (USA); General Motors Corp., Warren, MI (USA). Physics Dept.
• DOE Contract Number: AC02-76CH00016; AS05-80ER10742
• OSTI ID: 5337839
• Report Number(s): BNL-38395; CONF-860753-3; ON: DE86014773
• Resource Relation: Conference: International conference on EXAFS and near edge structure, Saumur, France, 7 Jul 1986
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COPPER
INTERFACES
HAFNIUM
AMORPHOUS STATE
FINE STRUCTURE
LAYERS
PHASE STUDIES
X-RAY SPECTRA
ELEMENTS
METALS
SPECTRA
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies