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Title: Characterization of multilayer reflectors and position sensitive detectors in the 45--300 A region

Conference · · Review of Scientific Instruments; (United States)
OSTI ID:5334070
;  [1]; ; ;  [2];  [3];  [4];  [5];  [6]; ;  [7]
  1. Institute of Space and Astronautical Science, Sagamihara 229 (Japan)
  2. Department of Physics, Osaka University, Toyonaka 560 (Japan)
  3. Department of Electronic Engineering, Miyazaki University, Miyazaki 889-20 (Japan)
  4. National Institute for Fusion Science, Nagoya 464-01 (Japan)
  5. Institute for Molecular Science, Okazaki 444 (Japan)
  6. National Astronomical Observatory, Mitaka 181 (Japan)
  7. Nikon Corporation, Tokyo 140 (Japan)

Multilayer reflectors and position sensitive detectors have been developed in constructing imaging optical systems in the 45--300 A region. Molybdenum-silicon (2{ital d}=140 A, {ital N}=20) and nickel--carbon (2{ital d}=100 A, {ital N}=20) multilayers were deposited on a spherical mirror (25 cm in diameter) for the normal incidence and on a segment of paraboloidal mirror (20 cm{times}10 cm) for 30{degree} grazing incidence. Their optical characteristics were evaluated by using characteristic x rays and monochromatized synchrotron radiation in the 45--300 A region. A position sensitive detector is made of a tandem microchannel plate (MCP) with a CsI photocathode and resistive plate, which is placed at the focal plane of each mirror. The detection efficiency and position resolution were measured by using characteristic x rays of C{ital K}{alpha} and monochromatized synchrotron radiation in the 45--200 A region.

OSTI ID:
5334070
Report Number(s):
CONF-910730-; CODEN: RSINA
Journal Information:
Review of Scientific Instruments; (United States), Vol. 63:1; Conference: 4. international conference on synchrotron radiation instrumentation, Chester (United Kingdom), 15-19 Jul 1991; ISSN 0034-6748
Country of Publication:
United States
Language:
English

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