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Title: Accelerated aging of extruded dielectric power cables. Part 2; Life testing of 15 kV XLPE-insulated cables

Journal Article · · IEEE Transactions on Power Delivery (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/61.127055· OSTI ID:5281820
;  [1]; ;  [2]
  1. Electric Power Research Inst., Washington, DC (US)
  2. Reynolds/CPI Technical Center, Scottsville, TX (US)

Attempts to successfully use accelerated aging tests to quantify the life of medium voltage power cables in service have been elusive. This paper describes preliminary results in which 15 kV XLPE cables were subjected to accelerated aging tests under a variety of controlled voltage stress and thermal load cycle conditions, with loss of life being calculated for each set of conditions in terms of the geometric mean time to failure (GMTF). In this paper the relative influence of voltage stress and load cycle temperature are discussed. This work is part of a broad effort that also involves studies with EPR-insulated cables, accelerated aging of cables from the same manufacturing run that are direct buried at the manufacturer's site, and also aging of these cables under normal operating conditions at four United States utilities.

OSTI ID:
5281820
Journal Information:
IEEE Transactions on Power Delivery (Institute of Electrical and Electronics Engineers); (United States), Vol. 7:2; ISSN 0885-8977
Country of Publication:
United States
Language:
English