Calculation of x-ray intensity from a rough sample based on a statistical model

Journal Article · Wed Jun 01 00:00:00 EDT 1988 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.340350· OSTI ID:5224429

Hwang, B; Houska, C R

An x-ray intensity correction is developed which begins with a roughness model that is often used to describe real surfaces. This is based upon a normal distribution of surface asperities relative to a mean plane. Pair correlation between absorbing elements along x-ray paths either entering or leaving the sample with respect to the signal producing element is accomplished by means of an exponential autocorrelation function. This allows the degree of roughness to be varied on a local scale to fit specific surfaces using statistical data. Equations are developed to describe x-ray fluorescence and diffraction signals for symmetric and asymmetric beam optics. Theory is compared with experiment using a roughened, fully stabilized zirconia sample.

• Research Organization: Department of Materials Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061
• OSTI ID: 5224429
• Journal Information: J. Appl. Phys.; (United States), Vol. 63:11
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
POWDERS
X-RAY DIFFRACTION
STATISTICAL MODELS
ABSORPTION SPECTRA
EXPERIMENTAL DATA
SURFACE PROPERTIES
THEORETICAL DATA
TOPOGRAPHY
ZIRCONIUM
COHERENT SCATTERING
DATA
DIFFRACTION
ELEMENTS
INFORMATION
MATHEMATICAL MODELS
METALS
NUMERICAL DATA
SCATTERING
SPECTRA
TRANSITION ELEMENTS
656003* - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)